[clean-list] CfP: A-MOST 2009

[Lars Frantzen]

                        A-MOST 2009
      5th Workshop on Advances in Model Based Testing

             April 1, 2009, Denver, Colorado, USA

              http://amost09.ist.tugraz.at/

                Co-located with ICST 2009
    (2nd International Conference on Software Testing,
               Verification and Validation)

                     *CALL FOR PAPERS*

The increasing use of software and the growing system complexity, in
size, heterogeneity, autonomy, physical distribution, and dynamicity
make focused software system testing a challenging task. Recent years
have seen an increasing industrial and academic interest in the use of
models for designing and testing software. Success has been reported
using a range of types of models using a variety of specification
formats, notations and formal languages, such as UML, SDL, B and Z.

The goal of the A-MOST workshop is to bring together researchers and
practitioners to discuss the current state of the art and practice as
well as future prospects for Model-Based software Testing (MBT).

Topics of interest for the Workshop include (but are not limited to):
------------------
Models:
- Models for component, integration and system testing
- Product-line models
- (Hybrid) embedded system models
- Systems-of-systems models
- Architectural models
- Models for orchestration and choreography of services
- Executable models and simulation
- Environment and use models
- Non-functional models

Processes, Methods and Tools:
- Model-based test generation algorithms
- Application of model checking techniques in model-based testing
- Tracing from requirements model to test models
- Performance and predictability of model-driven development
- Test model evolution during the software lifecycle
- Risk-based approaches for MBT
- Generation of testing-infrastructures from models
- Combinatorial approaches for MBT
- Statistical testing

Experiences and Evaluation:
- Non-functional/Quantitative MBT
- Estimating dependability (e.g., security, safety, reliability)
  using MBT
- Coverage metrics and measurements for structural and
  (non-)functional models
- Cost of testing, economic impact of MBT
- Empirical validation, experiences, case studies using MBT


Keynote:
-----------
Doron Peled (Bar Ilan University, Israel)


Submissions:
-----------
We invite submissions of full-length papers that describe new
research, tools, technologies, and industry experience, as well as
position papers. Papers should be submitted in PDF format and should
not exceed ten pages (including all text, figures, references and
appendices). Each submitted paper must conform to the IEEE Format
and Submission Guidelines. Check the webpage for further details:
http://amost09.ist.tugraz.at/


Proceedings:
-----------
Workshop Proceedings will be published in the IEEE Digital Library.
We are currently in discussions with the editor of a journal regarding
the possibility of authors of selected papers being invited to submit
an extended paper for a Special Issue.


Important Dates:
----------------
Submission Deadline: January 9, 2009
Notification:        February 27, 2009
Camera-Ready:        March 20, 2009
Workshop:            April 1, 2009


Organization:
-------------
Paul Ammann, George Mason University, USA
Gordon Fraser, Graz University of Technology, Austria
Franz Wotawa, Graz University of Technology, Austria


Programme Committee:
--------------------
Paul Ammann, George Mason University, USA
Mikhail Auguston, Naval Postgraduate School, USA
Paul Baker, Motorola, UK
Bob Binder, mVerify, USA
Lionel Briand, Simula Research Labs, Norway
Steve Counsell, Brunel University, UK
Lars Frantzen, Radboud University Nijmegen, The Netherlands
Gordon Fraser, Graz University of Technology, Austria
Angelo Gargantini, University of Bergamo, Italy
Wolfgang Grieskamp, Microsoft, USA
Roland Groz, INP ENSIMAG, Grenoble, France
Alan Hartman, IBM Research, Israel
Rob Hierons, Brunel University, UK
Mercedes Merayo, Universidad Complutense de Madrid, Spain
Brian Nielsen, Aalborg University, Denmark
Manuel Nunez, Universidad Complutense de Madrid, Spain
Ioannis Parissis, Laboratoire d'Informatique de Grenoble, France
Alexandre Petrenko, CRIM, Canada
Alexander Pretschner, ETH Zürich, Switzerland
Hasan Ural, University of Ottawa, Canada
Mark Utting, University of Waikato, New Zealand
Carsten Weise, Ericsson, Germany
Franz Wotawa, Graz University of Technology, Austria 

Sponsored by:
--------------------
Conformiq - Automated Test Design