[clean-list] A-MOST 2nd CfP - Extended Deadline - Special Issue

[Lars Frantzen]

                        A-MOST 2008
      4th Workshop on Advances in Model Based Testing

             April 9, 2008, Lillehammer, Norway

              http://kimba.mat.ucm.es/AMOST08/

                Co-located with ICST 2008
    (first International Conference on Software Testing,
               Verification and Validation)


          ***CALL FOR PAPERS - DEADLINE EXTENDED***

 ***SPECIAL ISSUE: Journal of Logic and Algebraic Programming***



Important Dates:
----------------
Submission Deadline: January 18, 2008 (EXTENDED)
Notification:        March 9, 2008
Camera-Ready:        March 21, 2008.
Workshop:            April 9, 2008.


We are happy to announce that a SPECIAL ISSUE of the

             Journal of Logic and Algebraic Programming

will be devoted to the best papers accepted in the workshop.


Summary
-------
The increasing use of software and the growing system complexity, in
size, heterogeneity, autonomy, physical distribution, and dynamicity
make focused software system testing a challenging task. Recent years
have seen an increasing industrial and academic interest in the use of
models for designing and testing software. Success has been reported
using a range of types of models using a variety of specification
formats, notations and formal languages, such as UML, SDL, B and Z.

The goal of the A- MOST workshop is to bring together researchers and
practitioners to discuss the current state of the art and practice as
well as future prospects for Model-Based software Testing (MBT).

Topics of interest for the Workshop include (but are not limited to):
------------------
Models:
- Models for component, integration and system testing
- Product-line models
- (Hybrid) embedded system models
- Systems-of-systems models
- Architectural models
- Models for orchestration and choreography of services
- Executable models and simulation
- Environment and use models
- Non-functional models

Processes, Methods and Tools:
- Model-based test generation algorithms
- Tracing from requirements model to test models
- Performance and predictability of model-driven development
- Test model evolution during the software lifecycle
- Risk-based approaches for MBT
- Generation of testing-infrastructures from models
- Combinatorial approaches for MBT
- Statistical testing

Experiences and Evaluation:
- Non-functional/Quantitative MBT
- Estimating dependability (e.g., security, safety, reliability)
  using MBT
- Coverage metrics and measurements for structural and
  (non-)functional models
- Cost of testing, economic impact of MBT
- Empirical validation, experiences, case studies using MBT


Submissions
-----------
We invite submissions of full-length papers that describe new
research, tools, technologies, and industry experience, as well as
position papers. Papers should be submitted in PDF format and should
not exceed ten pages (including all text, figures, references and
appendices). Each submitted paper must conform to the IEEE Format
and Submission Guidelines. Check the webpage for further details:
http://kimba.mat.ucm.es/AMOST08/


Proceedings
-----------
Workshop Proceedings will be published in the IEEE Digital Library.
A special issue of the  Journal of Logic and Algebraic Programming
will be devoted to the best papers accepted in the workshop.


Organization:
-------------
Lars Frantzen. Radboud University Nijmegen, The Netherlands.
Mercedes G. Merayo. Universidad Complutense de Madrid, Spain
Manuel Nunez. Universidad Complutense de Madrid, Spain


Programme Committee:
--------------------
Auguston, Mikhail. Naval Postgraduate School, USA
Baker, Paul. Motorola, UK
Baudry, Benoit. INRIA/IRISA Rennes, France
Bernstein, Larry. Stevens Institute of Technology, USA
Binder, Robert. mVerify, USA
Bochmann , Gregor v.. University of Ottawa, Canada
Bogdanov, Kirill. University of Sheffield, UK
Cavalli, Ana. GET-INT, France
Conrad, Mirko. The Mathworks, Munich, Germany
Counsell, Steve. Brunel University, UK
Dalal, Siddharta R. Xerox Corporation, USA
El-Fakih, Khaled. American University of Sharjah, UAE
Frantzen, Lars. Radboud University Nijmegen, The Netherlands
Fraser, Gordon. Graz University of Technology, Austria
Gao, Jerry. San Jose State University, USA
Ghosh, Sudipto. Colorado State University, USA
Grieskamp, Wolfgang. Microsoft Research, USA
Groz, Roland. INP ENSIMAG, Grenoble, France
Hartman, Alan. IBM Research, Israel
Hierons, Robert. Brunel University, UK
Jain, Ashish. Telcordia Technologies, USA
Jard, Claude. IRISA, Rennes, France
Leppaenen, Sari. Nokia Research Center, Finland
Merayo, Mercedes G.. Universidad Complutense de Madrid, Spain
Nielsen, Brian. University of Aalborg, Denmark
Nunez, Manuel. Universidad Complutense de Madrid,Spain
Petrenko, Alexandre. CRIM, Canada
Polini, Andrea. University of Camerino, Italy
Poore, Jesse. University of Tennessee, USA
Pretschner, Alexander. ETH Z?rich, Switzerland
Robinson-Mallett, Christopher. GETRAG FORD Transmissions GmbH, Germany
Rodriguez, Ismael. Universidad Complutense de Madrid, Spain
Schmaltz, Julien. Radboud University Nijmegen, The Netherlands
Tretmans, Jan. ESI - Embedded Systems Institute, The Netherlands
Ulrich, Andreas. Siemens AG, Germany
Utting, Mark. University of Waikato, New Zealand
Weiglhofer, Martin. Graz University of Technology, Austria
Weise, Carsten. Ericsson, Germany
Willcock, Colin. Nokia, Finland